X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 ? CRYSTALS WERE GROWN IN 0.085 M TRIS HYDROCHLORIDE PH 8.5, 0.17 M SODIUM ACETATE TRIHYDRATE, 25.5% W/V POLYETHYLENE GLYCOL 4,000, 15% V/V GLYCEROL.
Unit Cell:
a: 69.406 Å b: 80.979 Å c: 85.540 Å α: 79.06° β: 84.94° γ: 77.99°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.1 Solvent Content: 41.3
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.30 29.078 76619 3838 96.59 0.2343 0.2467 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.30 30.00 93.2 0.04 ? 14.50 2.28 ? 76619 ? 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.43 81.1 ? 2.56 2.22
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X6A ? NSLS X6A
Software
Software Name Purpose Version
PHENIX refinement (PHENIX.REFINE)
XDS data reduction .
SCALEPACK data scaling .
PHASER phasing .
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