X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.8 293 0.1M CHES-NaOH, 0.8M Na-Citrate, pH 8.8, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 125.706 Å b: 37.860 Å c: 98.404 Å α: 90.00° β: 126.79° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.09 Solvent Content: 60.23
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.350 19.980 15754 819 99.75 0.2034 0.2445 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.35 34.14 99.7 ? ? ? 5.0 15828 15781 0 0 41.7
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.35 2.48 99.7 ? ? 3.3 4.6 2252
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-17A 0.97865 Photon Factory BL-17A
Software
Software Name Purpose Version
SHELXD phasing .
PHENIX refinement (phenix.refine: 1.9_1692)
XDS data reduction .
SCALA data scaling .
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