X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.4 298.15 Tacsimate buffer, pH 6.4, VAPOR DIFFUSION, HANGING DROP, temperature 298.15K
Unit Cell:
a: 14.220 Å b: 23.247 Å c: 67.536 Å α: 94.270° β: 94.740° γ: 93.360°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.68 Solvent Content: 26.99
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.0000 23.1300 4442 228 76.8400 0.1243 0.1916 11.0855
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.0 50.0 76.9 0.098 ? 21 1.1 ? 4448 1.0 1.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.0 2.05 76.44 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5418 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.17.1_3660
CrystalClear data collection .
EPMR phasing .
HKL-2000 data reduction .
HKL-2000 data scaling .