ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	7.0	293	GGGMPPCP WAS CRYSTALLIZED BY SITTING DROP VAPOR DIFFUSION IN 0.1M HEPES PH 7.0, 200 MM MGCL2, AND 24-30% PEG 2000 MME USING A DROP SIZE OF 3 MICROL AND RESERVOIR VOLUME OF 65 MICROL. CRYSTALS GREW IN 3-5 DAYS AT 20C. THE ADDITION OF 200 MM LICL, NACL, KCL, OR NH4CL TO THE RESERVOIR SOLUTION DRAMATICALLY IMPROVED THE CRYSTALS. CRYSTALS GROWN IN THE PRESENCE OF KCL SHOWED THE BEST DIFFRACTION.

Unit Cell:

a: 44.151 Å b: 82.635 Å c: 95.014 Å α: 90.00° β: 96.68° γ: 90.00°

Symmetry:

Space Group: P 1 21 1

Crystal Properties:

Matthew's Coefficient: 2.19 Solvent Content: 43.71

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	2.2	30.0	34188	941	99.0	0.2253	0.2691	?

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.20	30.00	99.0	0.08	?	12.23	4.27	?	34206	?	-3.0	?

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.20	2.26	90.5		?	2.95	2.57

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		95 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
ROTATING ANODE	RIGAKU MICROMAX-007 HF	?	?	?

Software