X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 ? 19% PEG 3350, 100 MM MOPS PH 6.5.
Unit Cell:
a: 45.853 Å b: 90.939 Å c: 114.551 Å α: 77.30° β: 85.23° γ: 89.23°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.24 Solvent Content: 45.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 3.15 32.438 29758 1481 95.68 0.2379 0.3052 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.09 35.00 95.3 0.11 ? 7.24 1.8 ? 31271 ? 1.5 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.09 3.28 93.2 ? 1.58 1.83
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 ? BESSY 14.1
Software
Software Name Purpose Version
PHENIX refinement (PHENIX.REFINE: 1.8.1_1168)
XDS data reduction .
XDS data scaling .
MOLREP phasing .