X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.4 ? 1.28% (W/V) NONYL-GLUCOSIDE, 0.5% (W/V) DECYL-GLUCOSIDE, 0.01% (W/V) DODECYL-GLUCOSIDE, 0.1% (W/V) CHOLESTERYLHEMISUCCINATE, 10MM HEPES PH 8, 1.15 MM NACL, 2 MM DTT, 100 NM NTI, 26% (V/V) PEG 600, 50 MM GLYCINE PH 9.4
Unit Cell:
a: 58.550 Å b: 90.180 Å c: 209.360 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 3.68 Solvent Content: 66.54
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION OTHER ? 3.000 19.935 22639 1129 98.94 0.2436 0.2792 125.70
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.00 50.00 99.8 0.01 ? 8.68 6.9 ? 22942 ? 0.72 115.97
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA ? SLS X06SA
Software
Software Name Purpose Version
PHENIX refinement (PHENIX.REFINE)
XDS data reduction .
XSCALE data scaling .