X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.1 293 0.1M Tris-HCl pH 8.1, 1.25M Lithium Sulfate, 10mM AMPPNP, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 77.600 Å b: 86.720 Å c: 94.140 Å α: 73.870° β: 86.060° γ: 68.230°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.90 Solvent Content: 57.65
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MR-SAD ? 2.1750 45.1840 111585 5580 97.0100 0.2039 0.2460 39.5202
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.170 ? 97.400 0.133 ? 8.040 2.0 ? 112313 ? -3.000 29.030
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.170 2.300 92.800 ? ? 2.080 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-5A 0.97901 Photon Factory BL-5A
Software
Software Name Purpose Version
XSCALE data scaling .
SOLVE phasing .
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.14
XDS data scaling .
XDS data reduction .
PHASER phasing .