X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.3 293 0.1M Tris-HCl, pH 8.3, 1.175M Lithium Sulfate, 10mM L-Met, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 77.660 Å b: 86.750 Å c: 94.260 Å α: 73.740° β: 85.930° γ: 68.260°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.91 Solvent Content: 57.73
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 1.9550 45.1770 154238 7713 97.2300 0.1961 0.2312 22.2453
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.950 50 96.700 0.116 ? 9.940 4.0 ? 154262 ? -3.000 20.860
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.950 2.070 91.700 ? ? 2.310 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-17A 0.97939 Photon Factory BL-17A
Software
Software Name Purpose Version
XSCALE data scaling .
SOLVE phasing .
PHENIX refinement 1.9_1692
PDB_EXTRACT data extraction 3.14
XDS data scaling .
XDS data reduction .
PHASER phasing .