X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 50MM MES, 100MM AMMONIUM SULFATE, 10MM MGCL, 15-20%(w/v) PEG8000, pH 5.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 139.299 Å b: 139.299 Å c: 141.288 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 43 21 2
Crystal Properties:
Matthew's Coefficient: 3.74 Solvent Content: 67.14
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.629 46.505 40606 2001 96.90 0.1910 0.2160 55.1400
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.629 46.51 96.96 0.065 0.065 31.83 8.7 ? 40635 0.000 0.000 48.380
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.629 2.723 90.25 ? 0.391 4.86 4.8 3701
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL32B2 1.0 SPring-8 BL32B2
Software
Software Name Purpose Version
HKL-2000 data collection .
PHENIX model building (phenix.refine: 1.8.1_1168)
PHENIX refinement (phenix.refine: 1.8.1_1168)
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing 1.8.1_1168