X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.5 277 2M sodium/potassium phosphate, 100mM CAPS/NaOH, pH 10.5, 200mM lithium sulfate, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 103.774 Å b: 103.774 Å c: 184.451 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 2.60 Solvent Content: 52.64
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 3.100 29.73 21472 2004 99.97 0.2012 0.2199 70.26
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.1 29.732 99.9 0.103 ? 18.1 9.0 21509 21509 3 3 63.84
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.10 3.27 99.9 ? ? 4.4 9.1 3098
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.00608 SLS X06SA
Software
Software Name Purpose Version
XDS data scaling .
PHENIX model building (phenix: 1.8.2_1309)
PHENIX refinement (phenix.refine: 1.8.2_1309)
XDS data reduction .
SCALA data scaling .
PHENIX phasing 1.8.2_1309