X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.0 295 0.1M TRIS-HCL PH8.0, 0.2M LITHIUM SULFATE, 12% PEG 4000, VAPOR DIFFUSION, TEMPERATURE 295K
Unit Cell:
a: 95.210 Å b: 95.210 Å c: 154.891 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 62 2 2
Crystal Properties:
Matthew's Coefficient: 2.26 Solvent Content: 45.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.75 24.64 42392 2985 99.7 0.177 0.210 19.98
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.750 28.990 100.0 ? 0.12000 4.4000 10.600 42536 42536 ? ? 16.90
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.75 1.84 100.0 ? 0.43300 1.800 10.70 6069
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL41XU 1 SPring-8 BL41XU
Software
Software Name Purpose Version
BSS data collection .
SHELX model building C/D/E
REFMAC refinement 5.6.0117
MOSFLM data reduction .
SCALA data scaling .
SHELX phasing C/D/E