X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4.6 293 30% PEG2000, 0.2 M ammonium sulfate, 0.1M acetate buffer , pH 4.6, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 121.603 Å b: 56.827 Å c: 56.571 Å α: 90.00° β: 106.69° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.80 Solvent Content: 56.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.00 39.75 25023 ? ? ? 0.242 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.00 50.0 ? ? ? ? ? ? 25316 ? ? 14.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-1A 0.9789, 0.9792, 0.9640 Photon Factory BL-1A
Software
Software Name Purpose Version
HKL-2000 data collection .
SOLVE phasing .
CNS refinement 1.1
HKL-2000 data reduction .
HKL-2000 data scaling .