X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 9.5 293 0.8M sodium phosphate, 0.7M potassium phosphate, 0.2M lithium sulfate, 0.1M CHES, pH 9.5, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 185.935 Å b: 185.935 Å c: 185.935 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 41 3 2
Crystal Properties:
Matthew's Coefficient: 5.36 Solvent Content: 77.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.20 49.69 16465 1641 88.0 0.249 0.288 91.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.20 49.69 98.2 ? 0.068 24.1 9.5 18726 18382 0 -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.20 3.31 99.9 ? 0.386 9.1 9.6 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-5A 1.0000 Photon Factory BL-5A
Software
Software Name Purpose Version
HKL-2000 data collection .
MOLREP phasing .
CNS refinement 1.3
HKL-2000 data reduction .
HKL-2000 data scaling .