X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.8 293 26% PEG 4000, pH 3.8, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 33.820 Å b: 47.710 Å c: 42.450 Å α: 90.00° β: 107.52° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.73 Solvent Content: 28.8
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 0.90 30.86 91733 4590 96.4 0.121 0.130 4.5
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
0.900 30.860 96.4 0.05000 ? 18.6000 ? ? 91809 ? 0.000 3.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 0.90 0.95 94.9 ? ? 7.110 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SPRING-8 BEAMLINE BL38B1 ? SPring-8 BL38B1
Software
Software Name Purpose Version
XSCALE data scaling .
SHELX phasing .
PHENIX refinement 1.7.3_928
PDB_EXTRACT data extraction 3.10
XDS data reduction .
SHELXD phasing .