X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 4 293 16% PEG3350, 80% Tacsimate, 2% 1,2-propanediol, 5% MPD, 5% Glycerol, pH 4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 138.700 Å b: 46.936 Å c: 99.100 Å α: 90.00° β: 127.78° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 3.32 Solvent Content: 62.90
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.60 49.14 15054 1527 95.1 0.231 0.264 48.7
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.6 49.14 95.4 0.102 0.102 17.7 7.2 15779 15054 0.0 0.0 37.1
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.6 2.74 99.9 ? 0.374 4.7 7.3 2289
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 90 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE BL-17A 0.97898, 0.97917, 0.96395 Photon Factory BL-17A
Software
Software Name Purpose Version
ADSC data collection Quantum
SOLVE phasing .
CNS refinement 1.2
MOSFLM data reduction .
SCALA data scaling .