X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 10.5 ? 1.7M NA/K PHOSPHATE, 0.18M LITHIUM SULFATE, 0.1M CAPS, PH 10.5, VAPOR DIFFUSION, HANGING DROP,
Unit Cell:
a: 218.300 Å b: 84.600 Å c: 58.100 Å α: 90.000° β: 103.900° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.68 Solvent Content: 54.11
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.4000 45.4600 39412 3981 ? ? 0.2560 48.4034
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.400 45.460 97.800 ? ? ? ? ? 39412 ? 2.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.400 2.550 98.400 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100.0 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.3.1 0.9797, 0.9798, 1.02 ALS 8.3.1
Software
Software Name Purpose Version
MOSFLM data reduction .
PHASER phasing .
SOLVE phasing .
RESOLVE phasing .
CNS refinement 1.1
PDB_EXTRACT data extraction 3.10
SCALA data scaling .