X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 277 32%(w/v) PEG 3350, 0.3M KCl, 0.1M Na-MES, pH 6.0, vapor diffusion, hanging drop, temperature 277K
Unit Cell:
a: 52.910 Å b: 44.140 Å c: 53.990 Å α: 90.000° β: 115.190° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.2 Solvent Content: 44.0
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.3900 27.8000 45149 2282 99.1900 0.1886 0.2157 21.0294
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.388 32.452 99.200 0.053 0.053 13.300 3.700 45378 45378 ? ? 15.46009
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.39 1.42 95.32 ? ? ? 3.13 3193
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PHOTON FACTORY BEAMLINE AR-NW12A 1.000 Photon Factory AR-NW12A
Software
Software Name Purpose Version
MOSFLM data reduction 7.0.7
SCALA data scaling 3.3.20
MOLREP phasing 8.2.01
BUSTER-TNT refinement 2.11.2
PDB_EXTRACT data extraction 3.11
BUSTER refinement 2.11.2