X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 277 reservoir: 22.5% PEG3350, 0.2 M ammonium sulfate, 0.1 M HEPES, cryoprotectant: 25% PEG3350, 0.2 M ammonium sulfate, 0.1 M HEPES, 25% glycerol, pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 150.717 Å b: 150.717 Å c: 191.980 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 65
Crystal Properties:
Matthew's Coefficient: 2.54 Solvent Content: 51.52
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.500 38.665 84851 2005 99.68 0.2048 0.2385 63.5665
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 50.0 99.7 0.075 ? 14.6 3.8 ? 84960 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.590 100.0 ? ? ? 3.8 8498
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.979181 APS 24-ID-C
Software
Software Name Purpose Version
SCALEPACK data scaling .
PHENIX refinement 1.7_650
PDB_EXTRACT data extraction 3.10
ADSC data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
PHENIX phasing autosol
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