X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 295 0.1M Tris-HCl, 18-24% PEG 3000, 0.2M Ca(OAc)2, 3%(v/v) 1,6-hexanediol, 2mM tris(2-carboxyethyl)phosphine, pH 7.0, EVAPORATION, temperature 295K
Unit Cell:
a: 148.583 Å b: 148.583 Å c: 32.314 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: H 3
Crystal Properties:
Matthew's Coefficient: 2.12 Solvent Content: 42.03
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.3000 28.8760 11757 562 99.5600 0.2336 0.2736 48.4194
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.3 30 100 ? 0.098 24.3 5.1 11802 11802 0 -0.5 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.30 2.34 100.0 ? 0.276 4.5 4.8 594
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 77 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON PAL/PLS BEAMLINE 4A 0.97943, 0.97970, 0.98751, 0.97176 PAL/PLS 4A
Software
Software Name Purpose Version
PHENIX refinement 2011_12_05_2329
PDB_EXTRACT data extraction 3.10
HKL-2000 data reduction .
SCALEPACK data scaling .
SOLVE phasing .
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