X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 294 18% PEG3350, 0.1 M Bis-Tris, 0.12 M Li-sulfate, 4% propanol, 10 mM DTT, pH 6.5, VAPOR DIFFUSION, temperature 294K
Unit Cell:
a: 146.132 Å b: 69.513 Å c: 68.244 Å α: 90.000° β: 107.330° γ: 90.000°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.73 Solvent Content: 55.02
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.5900 38.6500 20291 1039 99.0100 0.2463 0.2699 48.7060
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.500 50.000 99.000 0.115 ? 7.900 3.700 ? 22802 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.500 2.590 98.200 ? ? ? 3.700 2231
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.5418 ? ?
Software
Software Name Purpose Version
SCALEPACK data scaling .
BUSTER-TNT refinement BUSTER 2.9.1
PDB_EXTRACT data extraction 3.10
HKL-2000 data collection .
DENZO data reduction .
PHASER phasing .
BUSTER refinement 2.9.1
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