X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 293 0.2M NA DIH PHOSPHATE, 20% PEG 3350, pH 7.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 53.424 Å b: 53.461 Å c: 53.477 Å α: 89.75° β: 89.78° γ: 89.94°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.27 Solvent Content: 45.84
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.95 50.00 37809 2000 92.20 0.18252 0.22215 34.888
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.95 50 92.5 0.034 0.034 32.7 2.2 39809 39809 0 -3 26.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.95 1.98 57.2 ? 0.075 10.6 2.1 1293
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-D 0.9787 APS 21-ID-D
Software
Software Name Purpose Version
MD2 data collection .
HKL-3000 phasing .
MOLREP phasing .
REFMAC refinement 5.6.0117
Coot model building .
HKL-2000 data reduction .
HKL-2000 data scaling .