X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 292 20% PEG 8000, 0.1M HEPES, pH 7.5, vapor diffusion, sitting drop, temperature 292K
Unit Cell:
a: 54.055 Å b: 74.670 Å c: 86.888 Å α: 90.000° β: 104.490° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 2.01 Solvent Content: 38.66
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.0400 40.8000 40459 1981 94.6200 0.2185 0.2338 37.2848
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.037 42.857 94.800 ? 0.084 10.800 3.500 40602 40602 0 -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.040 2.150 76.000 ? 0.444 1.700 2.500 4750
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06SA 1.0721 SLS X06SA
Software
Software Name Purpose Version
SCALA data scaling 3.3.9
BUSTER-TNT refinement BUSTER 2.9.3
PDB_EXTRACT data extraction 3.10
XDS data scaling .
XDS data reduction .
PHASER phasing .
BUSTER refinement 2.9.3