X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 289 20 %(w/v) PEG8000, HEPES pH 7.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 83.401 Å b: 83.401 Å c: 150.162 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 61 2 2
Crystal Properties:
Matthew's Coefficient: 2.29 Solvent Content: 46.29
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.851 40.180 25712 1283 95.08 0.172 0.201 27.6
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 50 99.7 ? 0.068 10.0 7.6 26959 26959 0.0 0.0 21.94
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.85 1.88 97.9 ? 0.771 1.8 3.9 1277
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-ID 0.97911 APS 19-ID
Software
Software Name Purpose Version
SBC-Collect data collection .
HKL-3000 data collection .
HKL-3000 phasing .
SHELXS phasing .
MLPHARE phasing .
BUCCANEER model building .
PHENIX refinement (phenix.refine: dev_851)
HKL-3000 data reduction .
HKL-3000 data scaling .
BUCCANEER phasing .
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