X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 25% PEG 3350, 0.2M NaCl, 0.1M Bis-Tris, 2% Hexandiol, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 119.687 Å b: 45.334 Å c: 68.607 Å α: 90.00° β: 97.95° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.15 Solvent Content: 42.73
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.68 50.00 35939 1924 90.71 0.1759 0.2132 25.911
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.68 50.0 99.9 0.039 0.039 24.38 4.1 41651 41594 -3.0 -3.0 16.368
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.68 1.69 99.4 ? 0.398 2.2 4.0 996
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 21-ID-F 0.979 APS 21-ID-F
Software
Software Name Purpose Version
MD2 data collection diffractometer software
HKL-3000 phasing SHELXC/D/E
MLPHARE phasing .
DM model building .
ARP/wARP model building .
RESOLVE model building .
CCP4 model building .
REFMAC refinement 5.6.0117
HKL-2000 data reduction .
HKL-2000 data scaling .
DM phasing .
RESOLVE phasing .
CCP4 phasing .