3UEO

X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 298 PEG 10000, Ammonium acetate, bis-Tris, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 58.810 Å b: 59.100 Å c: 78.310 Å α: 102.050° β: 98.040° γ: 114.340°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 2.55 Solvent Content: 51.77
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.6000 34.5660 26637 1330 95.3300 0.1920 0.2340 44.2076
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.600 34.6 95.200 0.059 ? 11.890 ? 26653 26653 ? -3.000 47.800
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.600 2.700 95.200 ? ? 2.230 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 298 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.97946 CLSI 08ID-1
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.1.4
PHENIX refinement 1.7.2_869
PDB_EXTRACT data extraction 3.10
XDS data scaling .
XDS data reduction .