X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 289 0.1M MES, 50 mM MgCl2, 50 mM NaCl, 15% PEG5K, 20% Glycerol, 25mM 9,10-Anthraquinone 2,6-disulfonate, pH 6.5, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 69.640 Å b: 106.090 Å c: 151.650 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 3.03 Solvent Content: 59.39
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 1.76 40.91 105111 5538 99.58 0.14565 0.17740 21.216
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.76 46.8 99.8 0.094 0.094 4.8 3.9 ? 110938 0 2.2 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.76 1.86 99.3 ? 0.332 3.7 3.7 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON DIAMOND BEAMLINE I04 0.9762 Diamond I04
Software
Software Name Purpose Version
xia2 data scaling .
SHELX model building .
REFMAC refinement 5.5.0109
MOSFLM data reduction .
SCALA data scaling .
SHELX phasing .