X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.1 293 0.6 M sodium formate, 21% PEG2000 MME, pH 7.1, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 52.419 Å b: 28.379 Å c: 104.806 Å α: 90.00° β: 95.99° γ: 90.00°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.73 Solvent Content: 28.78
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.050 26.066 16416 821 82.76 0.2478 0.2945 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.05 50.0 91.7 0.085 ? 13.4 3.4 19832 18186 2.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.050 2.120 59.3 ? ? 2.01 2.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 22-BM 1.0000,1.0719 APS 22-BM
Software
Software Name Purpose Version
PHENIX refinement 1.7_650
PDB_EXTRACT data extraction 3.10
HKL-2000 data collection .
HKL-2000 data reduction .
HKL-2000 data scaling .
SOLVE phasing .