X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.41 293 43.1% polyethylene glycol 400, 0.20M sodium chloride, 0.1M Na/K phosphate pH 6.41, Additive: 0.006 M zinc chloride, nanodrop, VAPOR DIFFUSION, SITTING DROP, temperature 293K
Unit Cell:
a: 82.901 Å b: 82.901 Å c: 364.175 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: P 65 2 2
Crystal Properties:
Matthew's Coefficient: 4.47 Solvent Content: 72.49
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT + MAD ? 2.972 29.543 16098 1649 99.07 0.2399 0.2566 99.6661
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.97 29.543 99.1 0.095 ? 13.1 4.6 ? 16179 ? -3.000 91.327
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.97 3.05 98.5 ? ? 1.5 4.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL9-2 0.91162,0.97919,0.97936 SSRL BL9-2
Software
Software Name Purpose Version
PHENIX refinement 1.7.1
PDB_EXTRACT data extraction 3.10
XSCALE data scaling January 30, 2009
PHASER phasing 2.3.0
CNS phasing 1.3
CNS refinement 1.3
MolProbity model building 3beta29
XDS data reduction .