X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 288 4% v/v tacsimate, 12% PEG3350, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 288K
Unit Cell:
a: 82.517 Å b: 91.845 Å c: 34.824 Å α: 90.00° β: 105.12° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.33 Solvent Content: 47.16
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.772 32.173 22668 1173 93.18 0.1767 0.2102 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.770 50.00 93.0 0.051 ? 26.6 7.4 24330 22670 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.77 1.80 83.7 ? ? 4.2 6.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU MICROMAX-007 ? ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.7.1_743
PHASER phasing .
REFMAC refinement 5.5.0066
HKL-2000 data reduction .
HKL-2000 data scaling .
CrystalClear data collection .