X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 28% PEG5000 MME, 150 mM Ammonium sulfate, 100 mM MES pH6.5, 10 mM ATP, 20 mM Manganese chloride, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 69.530 Å b: 83.060 Å c: 52.080 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 2
Crystal Properties:
Matthew's Coefficient: 1.96 Solvent Content: 37.34
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 1.850 26.658 25886 1311 98.06 0.1886 0.2516 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.85 27.31 98.5 ? ? ? 5.7 26303 25908 ? ? 21.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.85 1.95 96.8 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 130 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSLS BEAMLINE X25 0.9499 NSLS X25
Software
Software Name Purpose Version
CBASS data collection .
PHENIX model building .
PHENIX refinement (phenix.refine: dev_833)
MOSFLM data reduction .
SCALA data scaling .
PHENIX phasing .
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