X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 8.5 298 2M ammonium sulphate, 0.1M Tris pH8.5 + protein in 10 mM Tris pH 8, 38 mM NaCl, VAPOR DIFFUSION, HANGING DROP, temperature 298K
Unit Cell:
a: 53.419 Å b: 75.521 Å c: 86.859 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 2 2 2
Crystal Properties:
Matthew's Coefficient: 2.48 Solvent Content: 50.47
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD ? 2.30 27.0340 14755 1870 97.3000 0.2336 0.2984 40.8350
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.300 28.000 97.800 ? 0.088 10.700 3.400 14768 14768 0.0 0.0 37.6
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.300 2.340 87.100 ? 0.352 2.0 2.500 695
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.9793 SLS X06DA
Software
Software Name Purpose Version
DENZO data reduction .
SCALEPACK data scaling .
SHELX phasing .
SHELX model building .
PHENIX refinement dev_780
PDB_EXTRACT data extraction 3.10
go.com data collection .
SHELXCD phasing .
SHELXE model building .