X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 293 15% PEG 10,000, 0.1M citric acid pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 108.986 Å b: 108.986 Å c: 49.399 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 3
Crystal Properties:
Matthew's Coefficient: 2.83 Solvent Content: 56.54
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT ? 2.25 26.537 31094 1567 99.57 0.1721 0.2003 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 50.00 99.7 ? 0.150 12.4 8.0 ? 31135 ? 1.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.25 2.33 97.6 ? 0.593 2.1 3.9 3065
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9795 APS 24-ID-C
Software
Software Name Purpose Version
HKL-2000 data collection .
CCP4 model building Phaser
PHENIX refinement (phenix.refine: 1.7.1_743)
HKL-2000 data reduction .
HKL-2000 data scaling .
CCP4 phasing Phaser
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