3TIG

X-RAY DIFFRACTION


Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.5 294 0.1M Hepes 7.5, 8% Peg8000, 8% ethylene glycol, 0.05M Magnesium Chloride, 10mM Barium chloride, VAPOR DIFFUSION, HANGING DROP, temperature 294K
Unit Cell:
a: 116.570 Å b: 76.220 Å c: 44.240 Å α: 90.00° β: 90.64° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.25 Solvent Content: 45.25
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 2.50 44.24 12946 1308 95.8 0.250 0.298 73.4
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.5 50 99.9 ? 0.061 52 7 13383 13383 0 -3 41.4
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.50 2.54 99.8 ? 0.333 5 5.8 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 ? K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON ALS BEAMLINE 8.2.2 1.0781, 0.9806, 0.9637 ALS 8.2.2
Software
Software Name Purpose Version
BOS data collection .
SHARP phasing .
CNS refinement 1.3
HKL-2000 data reduction .
SCALEPACK data scaling .