X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5 289 BupsA.00863.i.A1 PW25353 at 2327 mg/mL against 10% PEG 1000, 10% PEG 8000, crystal tracking ID 221872c12, VAPOR DIFFUSION, SITTING DROP, temperature 289K
Unit Cell:
a: 41.060 Å b: 56.020 Å c: 46.810 Å α: 90.000° β: 96.030° γ: 90.000°
Symmetry:
Space Group: P 1 21 1
Crystal Properties:
Matthew's Coefficient: 1.84 Solvent Content: 33.3
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.7000 46.5500 22860 1169 97.9600 0.1839 0.2281 26.0146
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 50 98.100 0.049 ? 19.090 4.8 23338 22891 ? -3.000 29.204
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.740 97.400 ? ? 4.530 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON CLSI BEAMLINE 08ID-1 0.97949 CLSI 08ID-1
Software
Software Name Purpose Version
XSCALE data scaling .
PHASER phasing 2.1.4
REFMAC refinement .
PDB_EXTRACT data extraction 3.10
XDS data reduction .
Feedback Form
Name
Email
Institute
Feedback