X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 298 10% PEG3350, 0.4M NH4SO4, 10% Glycerol, pH 7.0, vapor diffusion, temperature 298K, VAPOR DIFFUSION
Unit Cell:
a: 159.639 Å b: 159.639 Å c: 679.826 Å α: 90.000° β: 90.000° γ: 120.000°
Symmetry:
Space Group: H 3 2
Crystal Properties:
Matthew's Coefficient: 4.41 Solvent Content: 72.12
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MR_SAD ? 3.9000 50.0 25629 1319 82.5100 0.2619 0.3247 139.1440
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.9 50 93.8 ? ? ? ? ? 28809 2.0 2.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.9 4.0 95.1 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9798 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
PHENIX refinement 1.6.4_486
PDB_EXTRACT data extraction 3.10
ADSC data collection Quantum
MOSFLM data reduction .
PHASER phasing .
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