X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.0 290 35% (v/v) 2-methyl-2,4-pentanediol, Na/K phosphate buffer pH6.2, pH 7.0, vapor diffusion, hanging drop, temperature 290K
Unit Cell:
a: 44.390 Å b: 44.390 Å c: 44.390 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 2 3
Crystal Properties:
Matthew's Coefficient: 2.01 Solvent Content: 38.88
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SIRAS THROUGHOUT 1.70 18.12 3047 326 99.53 0.24031 0.27424 28.374
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.700 ? 99.500 0.035 ? 29.740 ? ? 3384 ? -3.000 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.700 1.740 95.900 ? ? 3.070 ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.9196, 1.8443 APS 24-ID-C
Software
Software Name Purpose Version
XSCALE data scaling .
REFMAC refinement 5.5.0109
PDB_EXTRACT data extraction 3.10