X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.4 293 50% Tacsimate buffer, pH 6.4, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 14.026 Å b: 23.815 Å c: 67.657 Å α: 95.010° β: 94.690° γ: 94.860°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 1.69 Solvent Content: 27.18
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 1.6800 18.5100 7969 392 80.9400 0.1033 0.1413 13.7051
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.68 18.51 80.1 0.053 ? 19.4 1.1 ? 7978 ? ? ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.68 1.74 76.1 ? ? ? ? ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K ?
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE RIGAKU RUH3R 1.54 ? ?
Software
Software Name Purpose Version
PHENIX refinement 1.17.1_3660
CrystalClear data collection .
EPMR phasing .
HKL-2000 data reduction .
HKL-2000 data scaling .