ISDA

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	5.5	293	2-4% PEG 4K, 0.02M ammonium sulfate, 0.1M Na-MES, pH 5.5, VAPOR DIFFUSION, HANGING DROP, temperature 293K

Unit Cell:

a: 101.950 Å b: 116.780 Å c: 231.280 Å α: 90.00° β: 90.00° γ: 90.00°

Symmetry:

Space Group: F 2 2 2

Crystal Properties:

Matthew's Coefficient: 2.69 Solvent Content: 54.35

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	MOLECULAR REPLACEMENT	THROUGHOUT	3.09	54.41	12301	1004	?	0.2066	0.2597	77.21

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
3.09	55	94.6	0.10	?	11.67	3.0	12981	?	2.0	2.0	72.03

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	3.1	3.25	85.1	?	?	1.93	2.9	?

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		100 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	SOLEIL BEAMLINE PROXIMA 1	0.9800	SOLEIL	PROXIMA 1

Software