X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.6 293 7% PEG3350, 100 mM HEPES (pH 7.6), 80 mM NaCl, 2.5% 2-methyl-2,4-pentandiol (MPD), 5% glycerol, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 156.820 Å b: 134.080 Å c: 58.100 Å α: 90.00° β: 106.34° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 4.24 Solvent Content: 70.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 3.50 34.98 9831 520 71.00 0.26324 0.29540 140.837
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.5 35 70.6 ? 0.097 9.33 3.06 14649 10349 -3.0 -3.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.50 4.15 29.0 ? 0.595 2.25 3.03 1699
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.91841 BESSY 14.1
Software
Software Name Purpose Version
REFMAC refinement 5.6.0086
PHASER phasing .
CNS refinement 1.3
iMOSFLM data reduction .
XDS data reduction .
XDS data scaling .
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