X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 3.6 295.0 100mM Citric acid, 16%(v/v) MPD, pH 3.6, VAPOR DIFFUSION, HANGING DROP, temperature 295.0K
Unit Cell:
a: 91.897 Å b: 113.265 Å c: 143.467 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.75 Solvent Content: 55.27
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD ? 2.284 88.899 34218 1710 99.60 0.2095 0.2379 47.6666
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.28 88.9 99.5 0.082 ? 18.69 7.73 ? 34226 3.0 3.0 44.168
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.28 2.42 97.4 ? ? 3.31 7.4 10379
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SLS BEAMLINE X06DA 0.9794 SLS X06DA
Software
Software Name Purpose Version
RemDAq data collection .
SHARP phasing .
PHENIX refinement (phenix.refine: 1.6.1_357)
XDS data reduction package
XDS data scaling package