X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.5 291 1.0 M Ammonium sulfate, 0.1 M BIS-TRIS pH 5.5, 1% w/v Polyethylene glycol 3,350, VAPOR DIFFUSION, HANGING DROP, temperature 291 K
Unit Cell:
a: 101.031 Å b: 101.031 Å c: 71.529 Å α: 90.00° β: 90.00° γ: 120.00°
Symmetry:
Space Group: P 31 2 1
Crystal Properties:
Matthew's Coefficient: 3.33 Solvent Content: 63.06
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION Combination of MAD and Molecular replacement Rfree throughout 2.16 35.0 23002 1182 99.63 0.18804 0.22343 31.642
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.16 35 100.0 0.094 ? 26.7 11.3 23089 23089 0 -3.7 36.2
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.16 2.24 100.0 ? ? 4.5 11.1 2280
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON BESSY BEAMLINE 14.1 0.91841 BESSY 14.1
Software
Software Name Purpose Version
MxCuBE data collection .
SHELX model building C
SHELXD phasing .
SHELXE model building .
MOLREP phasing .
REFMAC refinement 5.6.0060
HKL-2000 data reduction .
HKL-2000 data scaling .
SHELX phasing C