X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 22.0% PEG 3350, 0.1M Magnesium Chloride, NANODROP, VAPOR DIFFUSION, SITTING DROP, temperature 277K
Unit Cell:
a: 118.907 Å b: 48.132 Å c: 144.732 Å α: 90.00° β: 98.44° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 1.95 Solvent Content: 36.83
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MAD THROUGHOUT 1.35 58.798 152408 5488 85.65 0.1387 0.1715 15.5987
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
1.35 58.798 85.8 0.086 0.086 11.1 6.600 152479 152479 ? ? 10.84
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 1.350 1.420 100.0 ? 0.625 2.3 5.7 25878
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON SSRL BEAMLINE BL11-1 0.91837,0.97971,0.97941 SSRL BL11-1
Software
Software Name Purpose Version
XDS data scaling .
XSCALE data scaling .
MOSFLM data reduction .
SCALA data scaling 3.3.15
SHELX phasing .
SHARP phasing .
SOLOMON phasing .
REFMAC refinement 5.5.0110
MolProbity model building 3beta29
PDB_EXTRACT data extraction 3.10
XDS data reduction (phasing) MOSFLM (refinement)
SHELXD phasing .
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