X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 5.0 293 0.1 M citrate/Bis-tris propane, 12% PEG3350, 10 mM DTT, 1 mM inhibitor, pH 5.0, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 83.946 Å b: 76.026 Å c: 60.288 Å α: 90.00° β: 106.68° γ: 90.00°
Symmetry:
Space Group: C 1 2 1
Crystal Properties:
Matthew's Coefficient: 2.53 Solvent Content: 51.37
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.25 27.08 16393 893 99.83 0.24781 0.27129 83.160
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.25 44.6 99.8 ? 0.062 10.1 3.7 17325 17325 0 0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.25 2.33 99.9 ? 0.446 2.3 3.7 1712
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 17-ID ? APS 17-ID
Software
Software Name Purpose Version
ADSC data collection Quantum
REFMAC refinement .
d*TREK data reduction .
d*TREK data scaling .
REFMAC phasing .