X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.7 288.0 16% PEG MME 5000, 0.18M ammonium sulfate, 0.1M MES, 0.002M cellotetraose, pH 6.7, VAPOR DIFFUSION, HANGING DROP, temperature 288.0K
Unit Cell:
a: 79.433 Å b: 101.508 Å c: 127.317 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: P 21 21 21
Crystal Properties:
Matthew's Coefficient: 2.35 Solvent Content: 47.62
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.11 22.76 56926 2910 99.53 0.17423 0.20597 12.088
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.10 30.00 99.9 ? 0.150 13.0 7.3 ? 60078 0.0 0.0 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.10 2.18 100.0 ? 0.469 4.3 7.2 5921
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 105 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON NSRRC BEAMLINE BL13B1 1.0 NSRRC BL13B1
Software
Software Name Purpose Version
HKL-2000 data collection .
REFMAC refinement 5.5.0110
HKL-2000 data reduction .
HKL-2000 data scaling .
REFMAC phasing 5.5.0110
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