X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.5 293 0.1M Imidazole pH=6.5 0.9M Sodium acetate, additive 2.0M NDSB-221, VAPOR DIFFUSION, HANGING DROP, temperature 293K
Unit Cell:
a: 140.135 Å b: 140.135 Å c: 140.135 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 3 2
Crystal Properties:
Matthew's Coefficient: 4.29 Solvent Content: 71.33
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 2.26 27.48 10697 537 99.35 0.18869 0.22890 46.279
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.26 50.00 99.8 0.088 ? 36.5 14 ? 11234 0 -3 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.26 2.30 ? ? ? 2.16 12.5 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 19-BM 0.97923 APS 19-BM
Software
Software Name Purpose Version
HKL-3000 data collection .
MOLREP phasing .
REFMAC refinement 5.5.0102
HKL-3000 data reduction .
HKL-3000 data scaling .
Feedback Form
Name
Email
Institute
Feedback