X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION ? 277 40 mM tri-potassium citrate, 10 % (w/v) polyethylene glycol (PEG) 3350, 10 mM EDTA, and 10 mM DTT, pH 8.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 114.700 Å b: 136.500 Å c: 149.700 Å α: 115.90° β: 106.00° γ: 95.00°
Symmetry:
Space Group: P 1
Crystal Properties:
Matthew's Coefficient: 3.34 Solvent Content: 63.20
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MIRAS ? 3.3 39.820 96873 1943 82.82 0.2590 0.2778 ?
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
3.3 40 95.9 0.056 ? 23.1 ? 114884 110174 1 1 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 3.3 3.42 80.3 ? ? 1.4 2.2 ?
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 ? K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-C 0.97949 APS 24-ID-C
Software
Software Name Purpose Version
HKL-2000 data collection .
SHARP phasing .
PHENIX refinement (phenix.refine: 1.7.1_743)
HKL-2000 data reduction .
DPS data reduction .