X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 7.4 277 50 mM Hepes-Na, 10 mM DTT, 2.5 mM EDTA, 9 to 11 % (w/v) PEG 3350, pH 7.4, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 235.200 Å b: 307.900 Å c: 375.900 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 21 21 21
Crystal Properties:
Matthew's Coefficient: ? Solvent Content: 78.4
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION MOLECULAR REPLACEMENT THROUGHOUT 7.80 33.00 12837 544 85.32 0.31023 0.32431 246.447
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
7.8 50 93.2 ? ? ? ? 15802 14728 1 1 ?
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 ? K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
SYNCHROTRON APS BEAMLINE 24-ID-E 0.9795 APS 24-ID-E
Software
Software Name Purpose Version
HKL-2000 data collection .
PHASER phasing .
REFMAC refinement 5.5.0109
HKL-2000 data reduction .
HKL-2000 data scaling .