X-RAY DIFFRACTION

Crystallization Details
Method pH Temprature Details
X-RAY DIFFRACTION 6.0 277 7.5% PEG 6000, 5% glycerol, 0.5mM DTT, 300mM NaCl, 0.1M MES, pH 6.0, VAPOR DIFFUSION, HANGING DROP, temperature 277K
Unit Cell:
a: 148.750 Å b: 148.750 Å c: 63.370 Å α: 90.00° β: 90.00° γ: 90.00°
Symmetry:
Space Group: I 4 2 2
Crystal Properties:
Matthew's Coefficient: 4.10 Solvent Content: 69.97
Refinement Statistics
Diffraction ID Structure Solution Method Cross Validation Method Resolution Limit (High) Resolution Limit (Low) Number of Reflections (Observed) Number of Reflections (R-free) Percent Reflections (Observed) R-Work R-Free Mean Isotropic
X-RAY DIFFRACTION SAD THROUGHOUT 2.039 47.039 22442 1970 97.69 0.1945 0.2187 36.5319
Data Collection
Overall
Resolution Limit (High) Resolution Limit (Low) Percent Possible (Observed) R Merge I (Observed) R Sym I (Observed) Net I Over Average Sigma (I) Redundancy Number Reflections (All) Number Reflections (Observed) Observed Criterion Sigma (F) Observed Criterion Sigma (I) B (Isotropic) From Wilson Plot
2.039 47.039 98.5 .058 .052 13.4 4.8 ? 22442 ? ? 41
Highest Resolution Shell
# Resolution Limits (Low) Resolution Limits (High) Percent Possible (All) Percent Possible (Observed) R-Sym I (Observed) Mean I Over Sigma (Observed) Redundancy Number Unique Reflections (All)
1 2.039 2.11 98.5 ? .052 13.4 4.8 22442
Diffraction
Diffraction experiment
Crystal ID Scattering Type Data Collection Temprature Detector Detector Type Details Collection Date Monochromator Protocol
1 100 K
Radiation Source
Source Type Wavelength List Synchrotron Site Beamline
ROTATING ANODE ENRAF-NONIUS FR591 1.5418 ? ?
Software
Software Name Purpose Version
MAR345dtb data collection .
SOLVE phasing .
PHENIX refinement (phenix.refine: 1.6.4_486)
iMOSFLM data reduction .
SCALA data scaling .