ISDA: 3RUY

X-RAY DIFFRACTION

Crystallization Details

Method	pH	Temprature	Details
X-RAY DIFFRACTION	8	298	20% PEG3350, 12.5mM suberic acid, 12.5mM sebacic acid, 12.5mM hexadecanedioic acid, 12.5mM dodecanedioic acid, 40% ethanol, 100mM HEPES, pH 8, VAPOR DIFFUSION, HANGING DROP, temperature 298K

Unit Cell:

a: 70.120 Å b: 98.291 Å c: 126.783 Å α: 90.0° β: 90.0° γ: 90.0°

Symmetry:

Space Group: P 21 21 21

Crystal Properties:

Matthew's Coefficient: 2.54 Solvent Content: 51.49

Refinement Statistics

Diffraction ID	Structure Solution Method	Cross Validation Method	Resolution Limit (High)	Resolution Limit (Low)	Number of Reflections (Observed)	Number of Reflections (R-free)	Percent Reflections (Observed)	R-Work	R-Free	Mean Isotropic
X-RAY DIFFRACTION	SAD	?	2.65	33.98	25490	1268	97.6	0.1976	0.2321	86.45

Data Collection

Overall

Resolution Limit (High)	Resolution Limit (Low)	Percent Possible (Observed)	R Merge I (Observed)	R Sym I (Observed)	Net I Over Average Sigma (I)	Redundancy	Number Reflections (All)	Number Reflections (Observed)	Observed Criterion Sigma (F)	Observed Criterion Sigma (I)	B (Isotropic) From Wilson Plot
2.65	?	97.6	0.057	?	27.3	5.8	26350	25718	1.5	2.1	67.9

Highest Resolution Shell

#	Resolution Limits (Low)	Resolution Limits (High)	Percent Possible (All)	Percent Possible (Observed)	R-Sym I (Observed)	Mean I Over Sigma (Observed)	Redundancy	Number Unique Reflections (All)
1	2.65	2.74	81.6	?	?	2.1	4.5	2598

Diffraction

Diffraction experiment

Crystal ID	Scattering Type	Data Collection Temprature	Detector	Detector Type	Details	Collection Date	Monochromator	Protocol
1		110 K

Radiation Source

Source	Type	Wavelength List	Synchrotron Site	Beamline
SYNCHROTRON	APS BEAMLINE 21-ID-G	0.97857	APS	21-ID-G

Software