X-RAY DIFFRACTION
Crystal ID | Scattering Type | Data Collection Temprature | Detector | Detector Type | Details | Collection Date | Monochromator | Protocol |
---|---|---|---|---|---|---|---|---|
1 | 298 K |
Source | Type | Wavelength List | Synchrotron Site | Beamline |
---|---|---|---|---|
ROTATING ANODE | ELLIOTT GX-20 | 1.5418 | ? | ? |
Software Name | Purpose | Version |
---|---|---|
San | data collection | Diego Multiwire Systems |
X-PLOR | model building | . |
X-PLOR | refinement | . |
San | data reduction | Diego Multiwire Systems |
San | data scaling | Diego Multiwire Systems |
X-PLOR | phasing | . |